- For corn grain, leaf or seed.
- Detects both Cry1F and Cry34Ab1 proteins (HERCULEX™ I, HERCULEX™ RW and HERCULEX™ XTRA)
- Multi-trait strip format provides 2 test lines specific to Cry1F and Cry34Ab1
- Useful for identity perservation programs and international import/export managers
- Coming soon
TraitChek Dual Trait Test Strip for the simultaneous detection of the Cry1F and Cry34Ab1 proteins found in HERCULEX™ I, HERCULEX™ RW and HERCULEX™ XTRA corn seed, leaf and grain. This multi-trait strip format provides two test lines each specific for either the Cry1F and/or Cry34Ab1 traits. This format will provide applications in the quality control of HERCULEX™ seed in breeding and production processes and in the testing of non-GMO grain at the 1% GMO level or less for both traits.
When added to the existing TraitChek Corn Comb Test for non-GMO grain testing, SDI will be able to offer up to 7 GMO traits with only 4 test strips which will offer substantial cost savings to identity preservation programs and international import/export managers. Used with the simple common corn extraction procedure, the TraitChek Corn Comb allows for the analysis of one corn sample to detect any combination or all of the following GMO proteins/traits: Cry1Ab (YieldGard®), CP4EPSPS (Roundup Ready®), Cry3Bb (YieldGard® Rootworm), Cry1F (HERCULEX™ I), Cry34Ab1 (HERCULEX™ RW), Cry9C (StarLink®) and PAT (LibertyLink®). |
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